Wenjing Rao, Alex Orailoglu, G. Su. Frugal linear network-based test decompression for drastic test cost reductions. In 2004 International Conference on Computer-Aided Design (ICCAD 04), November 7-11, 2004, San Jose, CA, USA. pages 721-725, IEEE Computer Society / ACM, 2004. [doi]
@inproceedings{RaoOS04,
title = {Frugal linear network-based test decompression for drastic test cost reductions},
author = {Wenjing Rao and Alex Orailoglu and G. Su},
year = {2004},
doi = {10.1145/1112239.1112352},
url = {http://doi.acm.org/10.1145/1112239.1112352},
tags = {rule-based, testing},
researchr = {https://researchr.org/publication/RaoOS04},
cites = {0},
citedby = {0},
pages = {721-725},
booktitle = {2004 International Conference on Computer-Aided Design (ICCAD 04), November 7-11, 2004, San Jose, CA, USA},
publisher = {IEEE Computer Society / ACM},
isbn = {0-7803-8702-3},
}