Robust and resilient designs from the bottom-up: Technology, CAD, circuit, and system issues - researchr publication authors

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Vijay Janapa Reddi, David Z. Pan, Sani R. Nassif, Keith A. Bowman. Robust and resilient designs from the bottom-up: Technology, CAD, circuit, and system issues. In Proceedings of the 17th Asia and South Pacific Design Automation Conference, ASP-DAC 2012, Sydney, Australia, January 30 - February 2, 2012. pages 7-16, IEEE, 2012. [doi]

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