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Low-Cost, Robust Data Acquisition System for Automotive Testing and Validation Using LabVIEW

P. Kiran Kumar Reddy, Rashmi A., Adarsha B. V., Govinda Raju M.. Low-Cost, Robust Data Acquisition System for Automotive Testing and Validation Using LabVIEW. In IEEE Region 10 Conference, TENCON 2023, Chiang Mai, Thailand, October 31 - Nov. 3, 2023. pages 612-616, IEEE, 2023. [doi]

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P. Kiran Kumar Reddy

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Rashmi A.

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Adarsha B. V.

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Govinda Raju M.

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