Birgit Reeb, Hans-Joachim Wunderlich. Deterministic Pattern Generation for Weighted Random Pattern Testing. In 1996 European Design and Test Conference, ED&TC 1996, Paris, France, March 11-14, 1996. pages 30-36, IEEE Computer Society, 1996. [doi]
@inproceedings{ReebW96,
title = {Deterministic Pattern Generation for Weighted Random Pattern Testing},
author = {Birgit Reeb and Hans-Joachim Wunderlich},
year = {1996},
doi = {10.1109/EDTC.1996.494124},
url = {http://doi.ieeecomputersociety.org/10.1109/EDTC.1996.494124},
researchr = {https://researchr.org/publication/ReebW96},
cites = {0},
citedby = {0},
pages = {30-36},
booktitle = {1996 European Design and Test Conference, ED&TC 1996, Paris, France, March 11-14, 1996},
publisher = {IEEE Computer Society},
isbn = {0-8186-7423-7},
}