John Regehr, Chen, Yang, Cuoq, Pascal, Eide, Eric, Ellison, Chucky, Yang, Xuejun. Test-case reduction for C compiler bugs. SIGPLAN Notices, 47(6):335-346, jun 2012. [doi]
@article{Regehr:2012:TRC:2345156.2254104,
title = {Test-case reduction for C compiler bugs},
author = {John Regehr and Chen, Yang and Cuoq, Pascal and Eide, Eric and Ellison, Chucky and Yang, Xuejun},
year = {2012},
month = {jun},
doi = {10.1145/2345156.2254104},
url = {http://doi.acm.org/10.1145/2345156.2254104},
tags = {rule-based, generic programming, testing, debugging, compiler, Pascal, systematic-approach, transformation, program transformation},
researchr = {https://researchr.org/publication/Regehr%3A2012%3ATRC%3A2345156.2254104},
cites = {0},
citedby = {0},
journal = {SIGPLAN Notices},
volume = {47},
number = {6},
pages = {335-346},
}