John Regehr. Random testing of interrupt-driven software. In Wayne Wolf, editor, EMSOFT 2005, September 18-22, 2005, Jersey City, NJ, USA, 5th ACM International Conference On Embedded Software, Proceedings. pages 290-298, ACM, 2005. [doi]
@inproceedings{Regehr05,
title = {Random testing of interrupt-driven software},
author = {John Regehr},
year = {2005},
doi = {10.1145/1086228.1086282},
url = {http://doi.acm.org/10.1145/1086228.1086282},
tags = {testing, random testing},
researchr = {https://researchr.org/publication/Regehr05},
cites = {0},
citedby = {0},
pages = {290-298},
booktitle = {EMSOFT 2005, September 18-22, 2005, Jersey City, NJ, USA, 5th ACM International Conference On Embedded Software, Proceedings},
editor = {Wayne Wolf},
publisher = {ACM},
isbn = {1-59593-091-4},
}