Marc Reichenbach, Ralf Seidler, Benjamin Pfundt, Dietmar Fey. Fast image processing for optical metrology utilizing heterogeneous computer architectures. Computers & Electrical Engineering, 40(4):1158-1170, 2014. [doi]
@article{ReichenbachSPF14,
title = {Fast image processing for optical metrology utilizing heterogeneous computer architectures},
author = {Marc Reichenbach and Ralf Seidler and Benjamin Pfundt and Dietmar Fey},
year = {2014},
doi = {10.1016/j.compeleceng.2013.09.008},
url = {http://dx.doi.org/10.1016/j.compeleceng.2013.09.008},
researchr = {https://researchr.org/publication/ReichenbachSPF14},
cites = {0},
citedby = {0},
journal = {Computers & Electrical Engineering},
volume = {40},
number = {4},
pages = {1158-1170},
}