Relevance of contact reliability in HBM-ESD test equipment - researchr publication bibtex

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Joachim C. Reiner, Thomas Keller. Relevance of contact reliability in HBM-ESD test equipment. Microelectronics Reliability, 41(9-10):1397-1401, 2001.

@article{ReinerK01,
  title = {Relevance of contact reliability in HBM-ESD test equipment},
  author = {Joachim C. Reiner and Thomas Keller},
  year = {2001},
  tags = {testing, C++, reliability},
  researchr = {https://researchr.org/publication/ReinerK01},
  cites = {0},
  citedby = {0},
  journal = {Microelectronics Reliability},
  volume = {41},
  number = {9-10},
  pages = {1397-1401},
}

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