Yujie Ren, Bin Liu, Shihai Wang. Joint Instance and Feature Adaptation for Heterogeneous Defect Prediction. IEEE Transactions on Reliability, 73(1):741-756, March 2024. [doi]
@article{RenLW24,
title = {Joint Instance and Feature Adaptation for Heterogeneous Defect Prediction},
author = {Yujie Ren and Bin Liu and Shihai Wang},
year = {2024},
month = {March},
doi = {10.1109/TR.2023.3305356},
url = {https://doi.org/10.1109/TR.2023.3305356},
researchr = {https://researchr.org/publication/RenLW24},
cites = {0},
citedby = {0},
journal = {IEEE Transactions on Reliability},
volume = {73},
number = {1},
pages = {741-756},
}