Xuanle Ren, Vítor Grade Tavares, R. D. (Shawn) Blanton. Detection of illegitimate access to JTAG via statistical learning in chip. In Wolfgang Nebel, David Atienza, editors, Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition, DATE 2015, Grenoble, France, March 9-13, 2015. pages 109-114, ACM, 2015. [doi]
@inproceedings{RenTB15,
title = {Detection of illegitimate access to JTAG via statistical learning in chip},
author = {Xuanle Ren and Vítor Grade Tavares and R. D. (Shawn) Blanton},
year = {2015},
url = {http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=7092367},
researchr = {https://researchr.org/publication/RenTB15},
cites = {0},
citedby = {0},
pages = {109-114},
booktitle = {Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition, DATE 2015, Grenoble, France, March 9-13, 2015},
editor = {Wolfgang Nebel and David Atienza},
publisher = {ACM},
isbn = {978-3-9815370-4-8},
}