Xiaojiao Ren, Ming Zhang, Nicolas Llaser, Yiqi Zhuang. On-Chip Measurement of Quality Factor Implemented in 0.35μm CMOS. Journal of Circuits, Systems, and Computers, 25(8):1-14, 2016. [doi]
@article{RenZLZ16,
title = {On-Chip Measurement of Quality Factor Implemented in 0.35μm CMOS},
author = {Xiaojiao Ren and Ming Zhang and Nicolas Llaser and Yiqi Zhuang},
year = {2016},
doi = {10.1142/S0218126616500870},
url = {http://dx.doi.org/10.1142/S0218126616500870},
researchr = {https://researchr.org/publication/RenZLZ16},
cites = {0},
citedby = {0},
journal = {Journal of Circuits, Systems, and Computers},
volume = {25},
number = {8},
pages = {1-14},
}