Yixin Ren, Hao Zhang, Yewei Xia, Jihong Guan, Shuigeng Zhou. Multi-Level Wavelet Mapping Correlation for Statistical Dependence Measurement: Methodology and Performance. In Brian Williams 0001, Yiling Chen 0001, Jennifer Neville, editors, Thirty-Seventh AAAI Conference on Artificial Intelligence, AAAI 2023, Thirty-Fifth Conference on Innovative Applications of Artificial Intelligence, IAAI 2023, Thirteenth Symposium on Educational Advances in Artificial Intelligence, EAAI 2023, Washington, DC, USA, February 7-14, 2023. pages 6499-6506, AAAI Press, 2023. [doi]
@inproceedings{RenZXGZ23, title = {Multi-Level Wavelet Mapping Correlation for Statistical Dependence Measurement: Methodology and Performance}, author = {Yixin Ren and Hao Zhang and Yewei Xia and Jihong Guan and Shuigeng Zhou}, year = {2023}, url = {https://ojs.aaai.org/index.php/AAAI/article/view/25799}, researchr = {https://researchr.org/publication/RenZXGZ23}, cites = {0}, citedby = {0}, pages = {6499-6506}, booktitle = {Thirty-Seventh AAAI Conference on Artificial Intelligence, AAAI 2023, Thirty-Fifth Conference on Innovative Applications of Artificial Intelligence, IAAI 2023, Thirteenth Symposium on Educational Advances in Artificial Intelligence, EAAI 2023, Washington, DC, USA, February 7-14, 2023}, editor = {Brian Williams 0001 and Yiling Chen 0001 and Jennifer Neville}, publisher = {AAAI Press}, isbn = {978-1-57735-880-0}, }