A Formal Study of Power Variability Issues and Side-Channel Attacks for Nanoscale Devices

Mathieu Renauld, François-Xavier Standaert, Nicolas Veyrat-Charvillon, Dina Kamel, Denis Flandre. A Formal Study of Power Variability Issues and Side-Channel Attacks for Nanoscale Devices. In Kenneth G. Paterson, editor, Advances in Cryptology - EUROCRYPT 2011 - 30th Annual International Conference on the Theory and Applications of Cryptographic Techniques, Tallinn, Estonia, May 15-19, 2011. Proceedings. Volume 6632 of Lecture Notes in Computer Science, pages 109-128, Springer, 2011. [doi]

Authors

Mathieu Renauld

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François-Xavier Standaert

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Nicolas Veyrat-Charvillon

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Dina Kamel

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Denis Flandre

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