David R. Resnick. Real World Built-in Test for VLSI. In Spring COMPCON 86, Digest of Papers, Thirty-First IEEE Computer Society International Conference, San Francisco, California, USA, March 3-6, 1986. pages 436-440, IEEE Computer Society, 1986.
@inproceedings{Resnick86,
title = {Real World Built-in Test for VLSI},
author = {David R. Resnick},
year = {1986},
tags = {testing},
researchr = {https://researchr.org/publication/Resnick86},
cites = {0},
citedby = {0},
pages = {436-440},
booktitle = {Spring COMPCON 86, Digest of Papers, Thirty-First IEEE Computer Society International Conference, San Francisco, California, USA, March 3-6, 1986},
publisher = {IEEE Computer Society},
isbn = {0-8186-0692-4},
}