Ives Rey-Otero, Mauricio Delbracio, Jean-Michel Morel. Comparing feature detectors: A bias in the repeatability criteria. In 2015 IEEE International Conference on Image Processing, ICIP 2015, Quebec City, QC, Canada, September 27-30, 2015. pages 3024-3028, IEEE, 2015. [doi]
@inproceedings{Rey-OteroDM15,
title = {Comparing feature detectors: A bias in the repeatability criteria},
author = {Ives Rey-Otero and Mauricio Delbracio and Jean-Michel Morel},
year = {2015},
doi = {10.1109/ICIP.2015.7351358},
url = {http://dx.doi.org/10.1109/ICIP.2015.7351358},
researchr = {https://researchr.org/publication/Rey-OteroDM15},
cites = {0},
citedby = {0},
pages = {3024-3028},
booktitle = {2015 IEEE International Conference on Image Processing, ICIP 2015, Quebec City, QC, Canada, September 27-30, 2015},
publisher = {IEEE},
isbn = {978-1-4799-8339-1},
}