Maria Riaz, Laurie Williams. Security requirements patterns: understanding the science behind the art of pattern writing. In Second IEEE International Workshop on Requirements Patterns, RePa 2012, Chicago, IL, USA, September 24, 2012. pages 29-34, IEEE, 2012. [doi]
@inproceedings{RiazW12,
title = {Security requirements patterns: understanding the science behind the art of pattern writing},
author = {Maria Riaz and Laurie Williams},
year = {2012},
doi = {10.1109/RePa.2012.6359977},
url = {http://dx.doi.org/10.1109/RePa.2012.6359977},
researchr = {https://researchr.org/publication/RiazW12},
cites = {0},
citedby = {0},
pages = {29-34},
booktitle = {Second IEEE International Workshop on Requirements Patterns, RePa 2012, Chicago, IL, USA, September 24, 2012},
publisher = {IEEE},
isbn = {978-1-4673-4374-9},
}