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Auger electron spectroscopy characterization of Ti/NiV/Ag multilayer back-metal for monitoring of Ni migration on Ag surface

R. Ricciari, E. P. Ferlito, G. Pizzo, M. Padalino, G. Anastasi, M. Sacchi, G. Pappalardo, C. Consalvo, Domenico Mello. Auger electron spectroscopy characterization of Ti/NiV/Ag multilayer back-metal for monitoring of Ni migration on Ag surface. Microelectronics Reliability, 55(9-10):1617-1621, 2015. [doi]

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