Parallel Implementation in a Industrial Framework of Statistical Tolerancing Analysis in Microelectronics - researchr publication authors

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Salvatore Rinaudo, Francesco Moschella, Marcello A. Anile. Parallel Implementation in a Industrial Framework of Statistical Tolerancing Analysis in Microelectronics. In Patrick Amestoy, Philippe Berger, Michel J. Daydé, Iain S. Duff, Valérie Frayssé, Luc Giraud, Daniel Ruiz, editors, Euro-Par 99 Parallel Processing, 5th International Euro-Par Conference, Toulouse, France, August 31 - September 3, 1999, Proceedings. Volume 1685 of Lecture Notes in Computer Science, pages 663-667, Springer, 1999. [doi]

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