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Supporting analysis of technical debt causes and effects with cross-company probabilistic cause-effect diagrams

Nicolli Rios, Rodrigo Oliveira Spínola, Manoel Gomes de Mendonça Neto, Carolyn B. Seaman. Supporting analysis of technical debt causes and effects with cross-company probabilistic cause-effect diagrams. In Paris Avgeriou, Klaus Schmid, editors, Proceedings of the Second International Conference on Technical Debt, TechDebt@ICSE 2019, Montreal, QC, Canada, May 26-27, 2019. pages 3-12, IEEE / ACM, 2019. [doi]

Authors

Nicolli Rios

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Rodrigo Oliveira Spínola

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Manoel Gomes de Mendonça Neto

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Carolyn B. Seaman

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