Cell Library Characterization at Low Voltage Using Non-linear Operating Point Analysis of Local Variations - researchr publication authors

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Rahul Rithe, Sharon Chou, Jie Gu, Alice Wang, Satyendra Datla, Gordon Gammie, Dennis Buss, Anantha Chandrakasan. Cell Library Characterization at Low Voltage Using Non-linear Operating Point Analysis of Local Variations. In VLSI Design 2011: 24th International Conference on VLSI Design, IIT Madras, Chennai, India, 2-7 January 2011. pages 112-117, IEEE, 2011. [doi]

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