Technology Acceptance Model: Worried about the Cultural Influence?

Cristóbal Fernández Robin, Scott McCoy, Luis Yáñez Sandivari, Diego Yáñez Martínez. Technology Acceptance Model: Worried about the Cultural Influence?. In Fiona Fui-Hoon Nah, editor, HCI in Business - First International Conference, HCIB 2014, Held as Part of HCI International 2014, Heraklion, Crete, Greece, June 22-27, 2014. Proceedings. Volume 8527 of Lecture Notes in Computer Science, pages 609-619, Springer, 2014. [doi]

Authors

Cristóbal Fernández Robin

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Scott McCoy

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Luis Yáñez Sandivari

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Diego Yáñez Martínez

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