Warren Robinett, Philip Kuekes, R. Stanley Williams. Defect Tolerance Based on Coding and Series Replication in Transistor-Logic Demultiplexer Circuits. IEEE Trans. on Circuits and Systems, 54-I(11):2410-2421, 2007. [doi]
@article{RobinettKW07,
title = {Defect Tolerance Based on Coding and Series Replication in Transistor-Logic Demultiplexer Circuits},
author = {Warren Robinett and Philip Kuekes and R. Stanley Williams},
year = {2007},
doi = {10.1109/TCSI.2007.907865},
url = {http://dx.doi.org/10.1109/TCSI.2007.907865},
researchr = {https://researchr.org/publication/RobinettKW07},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on Circuits and Systems},
volume = {54-I},
number = {11},
pages = {2410-2421},
}