Francesc Rocadenbosch, Ina Mattis, Albert Ansmann, Ulla Wandinger, Christine Böckmann, Gelsomina Pappalardo, Aldo Amodeo, Jens Bosenberg, Lucas Alados-Arboledas, Arnoud Apituley, Dimitris Balis, Anatoly Chaikovsky, Adolfo Comerón, Constantino Muñoz, Michaël Sicard, Volker Freudenthaler, Matthias Wiegner, Ove Gustafsson, Georg Hansen, Rodanthi-Elisabeth Mamouri, Alexandros Papayannis, Valentin Mitev, Doina Nicolae, Carlos Pérez, Maria Rita Perrone, Aleksander Pietruczuk, Manuel Pujadas, Jean-Philippe Putaud, Francois Ravetta, Vincenzo Rizi, Valentin Simeonov, Nicola Spinelli, Dimitar Stoyanov, Thomas Trickl. The European Aerosol Research Lidar Network (EARLINET): An Overview. In IEEE International Geoscience & Remote Sensing Symposium, IGARSS 2008, July 8-11, 2008, Boston, Massachusetts, USA, Proceedings. pages 410-413, IEEE, 2008. [doi]
@inproceedings{RocadenboschMAWBPABAABCCMSFWGHMPMNPPPPPRRSSST08,
title = {The European Aerosol Research Lidar Network (EARLINET): An Overview},
author = {Francesc Rocadenbosch and Ina Mattis and Albert Ansmann and Ulla Wandinger and Christine Böckmann and Gelsomina Pappalardo and Aldo Amodeo and Jens Bosenberg and Lucas Alados-Arboledas and Arnoud Apituley and Dimitris Balis and Anatoly Chaikovsky and Adolfo Comerón and Constantino Muñoz and Michaël Sicard and Volker Freudenthaler and Matthias Wiegner and Ove Gustafsson and Georg Hansen and Rodanthi-Elisabeth Mamouri and Alexandros Papayannis and Valentin Mitev and Doina Nicolae and Carlos Pérez and Maria Rita Perrone and Aleksander Pietruczuk and Manuel Pujadas and Jean-Philippe Putaud and Francois Ravetta and Vincenzo Rizi and Valentin Simeonov and Nicola Spinelli and Dimitar Stoyanov and Thomas Trickl},
year = {2008},
doi = {10.1109/IGARSS.2008.4779015},
url = {http://dx.doi.org/10.1109/IGARSS.2008.4779015},
researchr = {https://researchr.org/publication/RocadenboschMAWBPABAABCCMSFWGHMPMNPPPPPRRSSST08},
cites = {0},
citedby = {0},
pages = {410-413},
booktitle = {IEEE International Geoscience & Remote Sensing Symposium, IGARSS 2008, July 8-11, 2008, Boston, Massachusetts, USA, Proceedings},
publisher = {IEEE},
}