Dubravka Rocak, Darko Belavic, Marko Hrovat, Josef Sikula, Pavel Koktavy, Jan Pavelka, Vlasta Sedlakova. Low-frequency noise of thick-film resistors as quality and reliability indicator. Microelectronics Reliability, 41(4):531-542, 2001. [doi]
@article{RocakBHSKPS01,
title = {Low-frequency noise of thick-film resistors as quality and reliability indicator},
author = {Dubravka Rocak and Darko Belavic and Marko Hrovat and Josef Sikula and Pavel Koktavy and Jan Pavelka and Vlasta Sedlakova},
year = {2001},
doi = {10.1016/S0026-2714(00)00255-9},
url = {http://dx.doi.org/10.1016/S0026-2714(00)00255-9},
tags = {reliability},
researchr = {https://researchr.org/publication/RocakBHSKPS01},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {41},
number = {4},
pages = {531-542},
}