EUV and Hard X-ray Hartmann Wavefront Sensing for Optical Metrology, Alignment and Phase Imaging

Ombeline de La Rochefoucauld, Guillaume Dovillaire, Fabrice Harms, Mourad Idir, Lei Huang 0003, Xavier Levecq, Martin Piponnier, Philippe Zeitoun. EUV and Hard X-ray Hartmann Wavefront Sensing for Optical Metrology, Alignment and Phase Imaging. Sensors, 21(3):874, 2021. [doi]

@article{RochefoucauldDH21,
  title = {EUV and Hard X-ray Hartmann Wavefront Sensing for Optical Metrology, Alignment and Phase Imaging},
  author = {Ombeline de La Rochefoucauld and Guillaume Dovillaire and Fabrice Harms and Mourad Idir and Lei Huang 0003 and Xavier Levecq and Martin Piponnier and Philippe Zeitoun},
  year = {2021},
  doi = {10.3390/s21030874},
  url = {https://doi.org/10.3390/s21030874},
  researchr = {https://researchr.org/publication/RochefoucauldDH21},
  cites = {0},
  citedby = {0},
  journal = {Sensors},
  volume = {21},
  number = {3},
  pages = {874},
}