William J. Roesch. The ROCS Workshop and 25 years of compound semiconductor reliability. Microelectronics Reliability, 51(2):188-194, 2011. [doi]
@article{Roesch11,
title = {The ROCS Workshop and 25 years of compound semiconductor reliability},
author = {William J. Roesch},
year = {2011},
doi = {10.1016/j.microrel.2010.09.005},
url = {http://dx.doi.org/10.1016/j.microrel.2010.09.005},
tags = {reliability},
researchr = {https://researchr.org/publication/Roesch11},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {51},
number = {2},
pages = {188-194},
}