Kurt Rohloff, Joseph P. Loyall, Richard E. Schantz. Quality measures for embedded systems and their application to control and certification. SIGBED Review, 3(4):58-62, 2006. [doi]
@article{RohloffLS06,
title = {Quality measures for embedded systems and their application to control and certification},
author = {Kurt Rohloff and Joseph P. Loyall and Richard E. Schantz},
year = {2006},
doi = {10.1145/1183088.1183095},
url = {http://doi.acm.org/10.1145/1183088.1183095},
researchr = {https://researchr.org/publication/RohloffLS06},
cites = {0},
citedby = {0},
journal = {SIGBED Review},
volume = {3},
number = {4},
pages = {58-62},
}