Otto Aureliano Rolloff, Rodrigo Possamai Bastos, Laurent Fesquet. Exploiting reliable features of asynchronous circuits for designing low-voltage components in FD-SOI technology. Microelectronics Reliability, 55(9-10):1302-1306, 2015. [doi]
@article{RolloffBF15,
title = {Exploiting reliable features of asynchronous circuits for designing low-voltage components in FD-SOI technology},
author = {Otto Aureliano Rolloff and Rodrigo Possamai Bastos and Laurent Fesquet},
year = {2015},
doi = {10.1016/j.microrel.2015.07.028},
url = {http://dx.doi.org/10.1016/j.microrel.2015.07.028},
researchr = {https://researchr.org/publication/RolloffBF15},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {55},
number = {9-10},
pages = {1302-1306},
}