Quality-aware analysis in product line engineering with the orthogonal variability model

Fabricia Roos-Frantz, David Benavides, Antonio Ruiz Cortés, André Heuer, Kim Lauenroth. Quality-aware analysis in product line engineering with the orthogonal variability model. Software Quality Journal, 20(3-4):519-565, 2012. [doi]

@article{Roos-FrantzBCHL12,
  title = {Quality-aware analysis in product line engineering with the orthogonal variability model},
  author = {Fabricia Roos-Frantz and David Benavides and Antonio Ruiz Cortés and André Heuer and Kim Lauenroth},
  year = {2012},
  doi = {10.1007/s11219-011-9156-5},
  url = {http://dx.doi.org/10.1007/s11219-011-9156-5},
  researchr = {https://researchr.org/publication/Roos-FrantzBCHL12},
  cites = {0},
  citedby = {0},
  journal = {Software Quality Journal},
  volume = {20},
  number = {3-4},
  pages = {519-565},
}