Ashkan Roshan-Zamir, Shahin Jafarabadi-Ashtiani. A New Method for Measurement of Low-Frequency Noise of MOSFET. IEEE T. Instrumentation and Measurement, 62(11):2993-2997, 2013. [doi]
@article{Roshan-ZamirA13,
title = {A New Method for Measurement of Low-Frequency Noise of MOSFET},
author = {Ashkan Roshan-Zamir and Shahin Jafarabadi-Ashtiani},
year = {2013},
doi = {10.1109/TIM.2013.2266053},
url = {http://dx.doi.org/10.1109/TIM.2013.2266053},
researchr = {https://researchr.org/publication/Roshan-ZamirA13},
cites = {0},
citedby = {0},
journal = {IEEE T. Instrumentation and Measurement},
volume = {62},
number = {11},
pages = {2993-2997},
}