Bilateral diagonal principal component analysis based on matrix distance metrics: a projection technique for face identification

Chahrazed Rouabhia, Hicham Tebbikh. Bilateral diagonal principal component analysis based on matrix distance metrics: a projection technique for face identification. J. Electronic Imaging, 22(2):23020, 2013. [doi]

@article{RouabhiaT13,
  title = {Bilateral diagonal principal component analysis based on matrix distance metrics: a projection technique for face identification},
  author = {Chahrazed Rouabhia and Hicham Tebbikh},
  year = {2013},
  doi = {10.1117/1.JEI.22.2.023020},
  url = {http://dx.doi.org/10.1117/1.JEI.22.2.023020},
  researchr = {https://researchr.org/publication/RouabhiaT13},
  cites = {0},
  citedby = {0},
  journal = {J. Electronic Imaging},
  volume = {22},
  number = {2},
  pages = {23020},
}