Arousha Haghighian Roudsari, Jafar Afshar, Suan Lee, Wookey Lee. Comparison and Analysis of Embedding Methods for Patent Documents. In Herwig Unger, Jinho Kim, U Kang, Chakchai So-In, Junping Du, Walid Saad, Young-Guk Ha, Christian Wagner 0002, Julien Bourgeois, Chanboon Sathitwiriyawong, Hyuk-Yoon Kwon, Carson K. Leung, editors, IEEE International Conference on Big Data and Smart Computing, BigComp 2021, Jeju Island, South Korea, January 17-20, 2021. pages 152-155, IEEE, 2021. [doi]
@inproceedings{RoudsariALL21,
title = {Comparison and Analysis of Embedding Methods for Patent Documents},
author = {Arousha Haghighian Roudsari and Jafar Afshar and Suan Lee and Wookey Lee},
year = {2021},
doi = {10.1109/BigComp51126.2021.00037},
url = {https://doi.org/10.1109/BigComp51126.2021.00037},
researchr = {https://researchr.org/publication/RoudsariALL21},
cites = {0},
citedby = {0},
pages = {152-155},
booktitle = {IEEE International Conference on Big Data and Smart Computing, BigComp 2021, Jeju Island, South Korea, January 17-20, 2021},
editor = {Herwig Unger and Jinho Kim and U Kang and Chakchai So-In and Junping Du and Walid Saad and Young-Guk Ha and Christian Wagner 0002 and Julien Bourgeois and Chanboon Sathitwiriyawong and Hyuk-Yoon Kwon and Carson K. Leung},
publisher = {IEEE},
isbn = {978-1-7281-8924-6},
}