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The Value of Industry Certifications in ITE: Panel Discussion

Alan Rowland, Thomas Dawkins, James Risler, Thomas Ayers. The Value of Industry Certifications in ITE: Panel Discussion. In Tom Ayers, Steve Zilora, Bryan S. Goda, Daniel S. Bogaard, editors, Proceedings of the 19th Annual SIG Conference on Information Technology Education, SIGITE 2018, Fort Lauderdale, FL, USA, October 03-06, 2018. pages 84-85, ACM, 2018. [doi]

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Alan Rowland

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Thomas Dawkins

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James Risler

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Thomas Ayers

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