Improved Random Pattern Delay Fault Coverage Using Inversion Test Points - researchr publication authors

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Soham Roy, Brandon Stiene, Spencer K. Millican, Vishwani D. Agrawal. Improved Random Pattern Delay Fault Coverage Using Inversion Test Points. In 28th IEEE North Atlantic Test Workshop, NATW 2019, Burlington, VT, USA, May 13-15, 2019. pages 1-6, IEEE, 2019. [doi]

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