Applicability of LED-Based Excitation Source for Defect Depth Resolved Frequency Modulated Thermal Wave Imaging

Deboshree Roy, Suneet Tuli. Applicability of LED-Based Excitation Source for Defect Depth Resolved Frequency Modulated Thermal Wave Imaging. IEEE T. Instrumentation and Measurement, 66(10):2658-2665, 2017. [doi]

@article{RoyT17,
  title = {Applicability of LED-Based Excitation Source for Defect Depth Resolved Frequency Modulated Thermal Wave Imaging},
  author = {Deboshree Roy and Suneet Tuli},
  year = {2017},
  doi = {10.1109/TIM.2017.2711798},
  url = {https://doi.org/10.1109/TIM.2017.2711798},
  researchr = {https://researchr.org/publication/RoyT17},
  cites = {0},
  citedby = {0},
  journal = {IEEE T. Instrumentation and Measurement},
  volume = {66},
  number = {10},
  pages = {2658-2665},
}