Ana Ruiz, Carlos Couso, Natalia Seoane, Marc Porti, Antonio J. García-Loureiro, Montserrat Nafría. Methodology for the Simulation of the Variability of MOSFETs With Polycrystalline High-k Dielectrics Using CAFM Input Data. IEEE Access, 9:90568-90576, 2021. [doi]
@article{RuizCSPGN21,
title = {Methodology for the Simulation of the Variability of MOSFETs With Polycrystalline High-k Dielectrics Using CAFM Input Data},
author = {Ana Ruiz and Carlos Couso and Natalia Seoane and Marc Porti and Antonio J. García-Loureiro and Montserrat Nafría},
year = {2021},
doi = {10.1109/ACCESS.2021.3090472},
url = {https://doi.org/10.1109/ACCESS.2021.3090472},
researchr = {https://researchr.org/publication/RuizCSPGN21},
cites = {0},
citedby = {0},
journal = {IEEE Access},
volume = {9},
pages = {90568-90576},
}