Christian Russ. ESD issues in advanced CMOS bulk and FinFET technologies: Processing, protection devices and circuit strategies. Microelectronics Reliability, 48(8-9):1403-1411, 2008. [doi]
@article{Russ08,
title = {ESD issues in advanced CMOS bulk and FinFET technologies: Processing, protection devices and circuit strategies},
author = {Christian Russ},
year = {2008},
doi = {10.1016/j.microrel.2008.07.042},
url = {http://dx.doi.org/10.1016/j.microrel.2008.07.042},
researchr = {https://researchr.org/publication/Russ08},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {48},
number = {8-9},
pages = {1403-1411},
}