Measuring the Response Bias Induced by an Experience and Application Research Center

Boris E. R. de Ruyter, Rick van Geel, Panos Markopoulos. Measuring the Response Bias Induced by an Experience and Application Research Center. In Manfred Tscheligi, Boris E. R. de Ruyter, Panos Markopoulos, Reiner Wichert, Thomas Mirlacher, Alexander Meschtscherjakov, Wolfgang Reitberger, editors, Ambient Intelligence, European Conference, AmI 2009, Salzburg, Austria, November 18-21, 2009. Proceedings. Volume 5859 of Lecture Notes in Computer Science, pages 235-244, Springer, 2009. [doi]

@inproceedings{RuyterGM09,
  title = {Measuring the Response Bias Induced by an Experience and Application Research Center},
  author = {Boris E. R. de Ruyter and Rick van Geel and Panos Markopoulos},
  year = {2009},
  doi = {10.1007/978-3-642-05408-2_28},
  url = {http://dx.doi.org/10.1007/978-3-642-05408-2_28},
  tags = {e-science},
  researchr = {https://researchr.org/publication/RuyterGM09},
  cites = {0},
  citedby = {0},
  pages = {235-244},
  booktitle = {Ambient Intelligence, European Conference, AmI 2009, Salzburg, Austria, November 18-21, 2009. Proceedings},
  editor = {Manfred Tscheligi and Boris E. R. de Ruyter and Panos Markopoulos and Reiner Wichert and Thomas Mirlacher and Alexander Meschtscherjakov and Wolfgang Reitberger},
  volume = {5859},
  series = {Lecture Notes in Computer Science},
  publisher = {Springer},
  isbn = {978-3-642-05407-5},
}