Automated diagnosis of VLSI failures

Paul G. Ryan, Shishpal Rawat, W. Kent Fuchs. Automated diagnosis of VLSI failures. In 9th IEEE VLSI Test Symposium (VTS'91), 15-17 Apr 1991, Atlantic City, NJ, USA. pages 187-192, IEEE, 1991. [doi]

Authors

Paul G. Ryan

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Shishpal Rawat

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W. Kent Fuchs

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