Dongsu Ryu, Seogweon Chang. Novel concepts for reliability technology. Microelectronics Reliability, 45(3-4):611-622, 2005. [doi]
@article{RyuC05-1,
title = {Novel concepts for reliability technology},
author = {Dongsu Ryu and Seogweon Chang},
year = {2005},
doi = {10.1016/j.microrel.2004.10.010},
url = {http://dx.doi.org/10.1016/j.microrel.2004.10.010},
researchr = {https://researchr.org/publication/RyuC05-1},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {45},
number = {3-4},
pages = {611-622},
}