Leonid Ryzhyk, John Keys, Balachandra Mirla, Arun Raghunath, Mona Vij, Gernot Heiser. Improved device driver reliability through hardware verification reuse. In Rajiv Gupta, Todd C. Mowry, editors, Proceedings of the 16th International Conference on Architectural Support for Programming Languages and Operating Systems, ASPLOS 2011, Newport Beach, CA, USA, March 5-11, 2011. pages 133-144, ACM, 2011. [doi]
@inproceedings{RyzhykKMRVH11,
title = {Improved device driver reliability through hardware verification reuse},
author = {Leonid Ryzhyk and John Keys and Balachandra Mirla and Arun Raghunath and Mona Vij and Gernot Heiser},
year = {2011},
doi = {10.1145/1950365.1950383},
url = {http://doi.acm.org/10.1145/1950365.1950383},
tags = {reuse, reliability},
researchr = {https://researchr.org/publication/RyzhykKMRVH11},
cites = {0},
citedby = {0},
pages = {133-144},
booktitle = {Proceedings of the 16th International Conference on Architectural Support for Programming Languages and Operating Systems, ASPLOS 2011, Newport Beach, CA, USA, March 5-11, 2011},
editor = {Rajiv Gupta and Todd C. Mowry},
publisher = {ACM},
isbn = {978-1-4503-0266-1},
}