Automatic Marks Identification from Test Notes using Deep Learning Algorithm

Shruti S, Monisha M, Nishanthini V, Karthikeyan P. Automatic Marks Identification from Test Notes using Deep Learning Algorithm. In 14th International Conference on Computing Communication and Networking Technologies, ICCCNT 2023, Delhi, India, July 6-8, 2023. pages 1-4, IEEE, 2023. [doi]

Authors

Shruti S

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Monisha M

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Nishanthini V

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Karthikeyan P

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