Enver Sadikoglu, Eyüp Bilgiç. Characterization measurements of new family of ear simulators at TÜBİTAK UME. In IEEE International Symposium on Medical Measurements and Applications, MeMeA 2019, Istanbul, Turkey, June 26-28, 2019. pages 1-5, IEEE, 2019. [doi]
@inproceedings{SadikogluB19,
title = {Characterization measurements of new family of ear simulators at TÜBİTAK UME},
author = {Enver Sadikoglu and Eyüp Bilgiç},
year = {2019},
doi = {10.1109/MeMeA.2019.8802176},
url = {https://doi.org/10.1109/MeMeA.2019.8802176},
researchr = {https://researchr.org/publication/SadikogluB19},
cites = {0},
citedby = {0},
pages = {1-5},
booktitle = {IEEE International Symposium on Medical Measurements and Applications, MeMeA 2019, Istanbul, Turkey, June 26-28, 2019},
publisher = {IEEE},
isbn = {978-1-5386-8428-3},
}