Test-mode-only scan attack and countermeasure for contemporary scan architectures

Samah Mohamed Saeed, Sk Subidh Ali, Ozgur Sinanoglu, Ramesh Karri. Test-mode-only scan attack and countermeasure for contemporary scan architectures. In 2014 International Test Conference, ITC 2014, Seattle, WA, USA, October 20-23, 2014. pages 1-8, IEEE, 2014. [doi]

@inproceedings{SaeedASK14,
  title = {Test-mode-only scan attack and countermeasure for contemporary scan architectures},
  author = {Samah Mohamed Saeed and Sk Subidh Ali and Ozgur Sinanoglu and Ramesh Karri},
  year = {2014},
  doi = {10.1109/TEST.2014.7035357},
  url = {http://doi.ieeecomputersociety.org/10.1109/TEST.2014.7035357},
  researchr = {https://researchr.org/publication/SaeedASK14},
  cites = {0},
  citedby = {0},
  pages = {1-8},
  booktitle = {2014 International Test Conference, ITC 2014, Seattle, WA, USA, October 20-23, 2014},
  publisher = {IEEE},
  isbn = {978-1-4799-4722-5},
}