Sayandeep Saha, Rajat Subhra Chakraborty, Debdeep Mukhopadhyay. Testability Based Metric for Hardware Trojan Vulnerability Assessment. In Paris Kitsos, editor, 2016 Euromicro Conference on Digital System Design, DSD 2016, Limassol, Cyprus, August 31 - September 2, 2016. pages 503-510, IEEE Computer Society, 2016. [doi]
@inproceedings{SahaCM16,
title = {Testability Based Metric for Hardware Trojan Vulnerability Assessment},
author = {Sayandeep Saha and Rajat Subhra Chakraborty and Debdeep Mukhopadhyay},
year = {2016},
doi = {10.1109/DSD.2016.17},
url = {http://doi.ieeecomputersociety.org/10.1109/DSD.2016.17},
researchr = {https://researchr.org/publication/SahaCM16},
cites = {0},
citedby = {0},
pages = {503-510},
booktitle = {2016 Euromicro Conference on Digital System Design, DSD 2016, Limassol, Cyprus, August 31 - September 2, 2016},
editor = {Paris Kitsos},
publisher = {IEEE Computer Society},
isbn = {978-1-5090-2817-7},
}