Sayandeep Saha, Rajat Subhra Chakraborty, Srinivasa Shashank Nuthakki, Anshul, Debdeep Mukhopadhyay. Improved Test Pattern Generation for Hardware Trojan Detection Using Genetic Algorithm and Boolean Satisfiability. In Tim Güneysu, Helena Handschuh, editors, Cryptographic Hardware and Embedded Systems - CHES 2015 - 17th International Workshop, Saint-Malo, France, September 13-16, 2015, Proceedings. Volume 9293 of Lecture Notes in Computer Science, pages 577-596, Springer, 2015. [doi]
@inproceedings{SahaCNAM15,
title = {Improved Test Pattern Generation for Hardware Trojan Detection Using Genetic Algorithm and Boolean Satisfiability},
author = {Sayandeep Saha and Rajat Subhra Chakraborty and Srinivasa Shashank Nuthakki and Anshul and Debdeep Mukhopadhyay},
year = {2015},
doi = {10.1007/978-3-662-48324-4_29},
url = {http://dx.doi.org/10.1007/978-3-662-48324-4_29},
researchr = {https://researchr.org/publication/SahaCNAM15},
cites = {0},
citedby = {0},
pages = {577-596},
booktitle = {Cryptographic Hardware and Embedded Systems - CHES 2015 - 17th International Workshop, Saint-Malo, France, September 13-16, 2015, Proceedings},
editor = {Tim Güneysu and Helena Handschuh},
volume = {9293},
series = {Lecture Notes in Computer Science},
publisher = {Springer},
isbn = {978-3-662-48323-7},
}