Sudheer Sahu, John H. Reif. Capabilities and Limits of Compact Error Resilience Methods for Algorithmic Self-assembly in Two and Three Dimensions. In Chengde Mao, Takashi Yokomori, editors, DNA Computing, 12th International Meeting on DNA Computing, DNA12, Seoul, Korea, June 5-9, 2006, Revised Selected Papers. Volume 4287 of Lecture Notes in Computer Science, pages 223-238, Springer, 2006. [doi]
@inproceedings{SahuR06,
title = {Capabilities and Limits of Compact Error Resilience Methods for Algorithmic Self-assembly in Two and Three Dimensions},
author = {Sudheer Sahu and John H. Reif},
year = {2006},
doi = {10.1007/11925903_17},
url = {http://dx.doi.org/10.1007/11925903_17},
researchr = {https://researchr.org/publication/SahuR06},
cites = {0},
citedby = {0},
pages = {223-238},
booktitle = {DNA Computing, 12th International Meeting on DNA Computing, DNA12, Seoul, Korea, June 5-9, 2006, Revised Selected Papers},
editor = {Chengde Mao and Takashi Yokomori},
volume = {4287},
series = {Lecture Notes in Computer Science},
publisher = {Springer},
isbn = {3-540-49024-8},
}