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Churn Rate Aware Interference Management for Device-to-Device Communications in SDNs

Hunny Saini, Santosh K. Singh, Abhay Kumar Sah, Satya K. Vankayala. Churn Rate Aware Interference Management for Device-to-Device Communications in SDNs. In IEEE International Conference on Communications, ICC 2023 - Workshops, Rome, Italy, May 28 - June 1, 2023. pages 188-193, IEEE, 2023. [doi]

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Hunny Saini

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Santosh K. Singh

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Abhay Kumar Sah

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Satya K. Vankayala

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