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Is Popularity a Measure of Quality? An Analysis of Maven Components

Hitesh Sajnani, Vaibhav Saini, Joel Ossher, Cristina Videira Lopes. Is Popularity a Measure of Quality? An Analysis of Maven Components. In 30th IEEE International Conference on Software Maintenance and Evolution, Victoria, BC, Canada, September 29 - October 3, 2014. pages 231-240, IEEE, 2014. [doi]

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Hitesh Sajnani

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Vaibhav Saini

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Joel Ossher

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Cristina Videira Lopes

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