Yukinobu Sakata, Shun ichi Kaneko, Yuji Takagi, Hirohito Okuda. Successive pattern classification based on test feature classifier and its application to defect image classification. Pattern Recognition, 38(11):1847-1856, 2005. [doi]
@article{SakataKTO05,
title = {Successive pattern classification based on test feature classifier and its application to defect image classification},
author = {Yukinobu Sakata and Shun ichi Kaneko and Yuji Takagi and Hirohito Okuda},
year = {2005},
doi = {10.1016/j.patcog.2005.04.013},
url = {http://dx.doi.org/10.1016/j.patcog.2005.04.013},
tags = {rule-based, classification, testing},
researchr = {https://researchr.org/publication/SakataKTO05},
cites = {0},
citedby = {0},
journal = {Pattern Recognition},
volume = {38},
number = {11},
pages = {1847-1856},
}